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Electrical Characteristics
2.6.5.6
Receiver Eye Diagrams
For each baud rate at which an LP-Serial receiver is specified to operate, the receiver shall meet the corresponding bit error rate
specification ( Table 32 , Table 33 , and Table 34 ) when the eye pattern of the receiver test signal (exclusive of sinusoidal jitter)
falls entirely within the unshaded portion of the receiver input compliance mask shown in Figure 14 with the parameters
specified in Table 35 . The eye pattern of the receiver test signal is measured at the input pins of the receiving device with the
device replaced with a 100 Ω ± 5% differential resistive load.
V DIFF max
V DIFF min
0
–V DIFF min
–V DIFF max
0
A
B
1–B
1–A
1
Time (UI)
Figure 14. Receiver Input Compliance Mask
Table 35. Receiver Input Compliance Mask Parameters Exclusive of Sinusoidal Jitter
1.25 GBaud
2.5 GBaud
3.125 GBaud
Receiver Type
V DIFF min (mV)
100
100
100
V DIFF max (mV)
800
800
800
A (UI)
0.275
0.275
0.275
B (UI)
0.400
0.400
0.400
2.6.5.7
Measurement and Test Requirements
Since the LP-Serial electrical specification are guided by the XAUI electrical interface specified in Clause 47 of IEEE Std.
802.3ae-2002?, the measurement and test requirements defined here are similarly guided by Clause 47. In addition, the CJPAT
test pattern defined in Annex 48A of IEEE Std. 802.3ae-2002 is specified as the test pattern for use in eye pattern and jitter
measurements. Annex 48B of IEEE Std. 802.3ae-2002 is recommended as a reference for additional information on jitter test
methods.
MSC8144 Quad Core Digital Signal Processor Data Sheet, Rev. 16
Freescale Semiconductor
49
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